VENTURA, Anton Justo et al. Comparing Analytical and AI-based Image Analysis for Micron-sized Particle Detection and Measurement. Philippine Engineering Journal, [S.l.], v. 46, n. 01, aug. 2025. ISSN 2718-9287. Available at: <https://journals.upd.edu.ph/index.php/pej/article/view/10760>. Date accessed: 16 sep. 2025.