MERCADO, Candy.
 Comparing Analytical and AI-based Image Analysis for Micron-sized Particle Detection and Measurement.
<strong>Philippine Engineering Journal</strong>, [S.l.], v. 46, n. 01, aug. 2025.
ISSN 2718-9287.
Available at: &lt;<a href="https://journals.upd.edu.ph/index.php/pej/article/view/10761" target="_new">https://journals.upd.edu.ph/index.php/pej/article/view/10761</a>&gt;. Date accessed: 02 oct. 2025.