SAMSON, E. C.; BLANCA, C. M.; SALOMA, C. A..
Near-IR Spectral Imaging of Semiconductor Absorption Sites in Integrated Circuits.
Science Diliman: A Journal of Pure and Applied Sciences, [S.l.], v. 16, n. 2, july 2007.
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Available at: <https://journals.upd.edu.ph/index.php/sciencediliman/article/view/117>. Date accessed: 05 aug. 2025.