SAMSON, E. C.; BLANCA, C. M.; SALOMA, C. A.. Near-IR Spectral Imaging of Semiconductor Absorption Sites in Integrated Circuits. Science Diliman: A Journal of Pure and Applied Sciences, [S.l.], v. 16, n. 2, july 2007. ISSN 2012-0818. Available at: <https://journals.upd.edu.ph/index.php/sciencediliman/article/view/117>. Date accessed: 05 aug. 2025.