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 Analysis of Crack Propagation Under Different Die Tilt Configuration on a Small Outline Transistor.
<strong>Philippine Engineering Journal</strong>, [S.l.], v. 41, n. 1, june 2020.
ISSN 2718-9287.
Available at: &lt;<a href="https://journals.upd.edu.ph/index.php/pej/article/view/7145" target="_new">https://journals.upd.edu.ph/index.php/pej/article/view/7145</a>&gt;. Date accessed: 03 sep. 2025.