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 Terahertz-Time Domain Spectroscopic (THz-TDS) Measurement of Moderately-Doped Silicon Using InAs Emitter Under Magnetic Field.
<strong>Science Diliman: A Journal of Pure and Applied Sciences</strong>, [S.l.], v. 13, n. 2, july 2012.
ISSN 2012-0818.
Available at: &lt;<a href="https://journals.upd.edu.ph/index.php/sciencediliman/article/view/181" target="_new">https://journals.upd.edu.ph/index.php/sciencediliman/article/view/181</a>&gt;. Date accessed: 27 sep. 2025.