High-Resolution Differential Thermography of Semiconductor Edifices

  • Vera Marie Sastine
  • Vernon Julius Cemine
  • Carlo Mar Blanca
  • Caesar Saloma

Abstract

We develop a cost-effective, high-resolution, and noninvasive imaging technique for thermal mapping of semiconductor edifices in integrated circuits. Initial implementation was done using a power-stabilized optical feedback laser system that detects changes in the optical beam-induced current when the package temperature of the device is increased. The linear change in detected current can be translated to a thermal gradient, which can reveal semiconductor “hotspots”—localized sites with anomalous thermal activity. These locales are possible fault sites or areas susceptible to defects, which are the best jump-off points for failure analysis.
Published
2007-07-13
How to Cite
SASTINE, Vera Marie et al. High-Resolution Differential Thermography of Semiconductor Edifices. Science Diliman: A Journal of Pure and Applied Sciences, [S.l.], v. 16, n. 2, july 2007. ISSN 2012-0818. Available at: <https://journals.upd.edu.ph/index.php/sciencediliman/article/view/107>. Date accessed: 20 july 2025.
Section
Articles

Most read articles by the same author(s)

1 2 > >>