Two-Photon Optical Beam-Induced Current Microscopy of Light-Emitting Diodes
Abstract
We demonstrate two-photon optical beam-induced current (2P-OBIC) microscopy of light-emitting diodes (LEDs). We utilized a Ti:Sapphire femtosecond laser source operating at 800 nm to derive the 2P-OBIC signal from a 605 nm band-gap LED. The spatial confinement of free carrier generation only at the focus and the quadratic dependence of the 2P-OBIC signal on excitation power are the key principles in two-photon excitation. As a consequence, superior image quality evident in the 2P-OBIC images of LEDs are obtained. These features decrease the linear absorption and wide-angle scattering effects plaguing single-photon optical beam-induced current (1P-OBIC) technique, thereby increasing the resolution of the imaging system in the axial and lateral directions. Thus, the attainment of good axial discrimination in the LED samples is obtained even without a confocal pinhole. In addition, 2P-OBIC images reveal local variations in free carrier densities which are not evident in the single-photon excitation.
Published
2007-07-13
Issue
Section
Articles
Submission of a manuscript implies: that the work described has not been published before (except in the form of an abstract or as part of a published lecture, review, or thesis); that it is not under consideration for publication elsewhere; that its publication has been approved by all co-authors, if any, as well as by the responsible authorities at the institute where the work has been carried out; that, if and when the manuscript is accepted for publication, the authors agree to the automatic transfer of the copyright to the publisher; that the manuscript will not be published elsewhere in any language without the consent of the copyright holders; that written permission of the copyright holder is obtained by the authors for material used from other copyrighted sources; and that any costs associated with obtaining this permission are the authors’ responsibility.